Keysight / Agilent N5230C PNA-L Network Analyzer, From 300 kHz 20 GHz

Keysight / Agilent N5230C PNA-L Network Analyzer, From 300 kHz 20 GHz

Keysight / Agilent N5230C/225 PNA-L Network Analyzer, From 300 kHz 20 GHz, 2 Ports

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Product Description

Keysight / Agilent N5230C PNA-L Network Analyzer, From 300 kHz 20 GHz

The PNA-L is designed for your general purpose network analysis needs and priced for your budget. Advanced features help you work quickly, easily, and accurately. With the same firmware as the PNA, the PNA-L offers the perfect balance of value and performance.

The PNA-L is equipped with a built-in S-parameter test set, one or two synthesized sources used for device stimulus, a hard disk drive, USB interfaces, and an 8.4” LCD color touch screen display. 40 and 50 GHz models have 2.4 mm ruggedized male 50-ohm connectors, while all other models have 3.5 mm ruggedized male 50-ohm connectors. Included with each instrument is a mouse, keyboard (U.S.) and a 1-year return-to-Agilent service warranty.

The PNA-L is available with frequency coverage from 300 kHz to 6 and 13.5 GHz, 10 MHz to 20, 40, or 50 GHz and offers capabilities that can dramatically increase your design and test efficiency. 4-port models are also available from 300 kHz to 13.5 or 20 GHz. The Windows® operating system provides the ability to expand the connectivity of the instrument and provides tools for maximum flexibility. From the Windows desktop you can install measurement tools, which reduce the need for a dedicated PC. Use embedded Help to quickly refer to programming and user documentation from within the instrument. Furthermore, COM/DCOM programming provides a powerful automation environment.
The enhanced user interface, crisp display with touch screen, and flexible remote interfaces maximize productivity in design and production environments.

  • Frequency options:
    • 300 kHz to 6 GHz
    • 300 kHz to 13.5 GHz
    • 300 kHz to 20 GHz
    • 10 MHz to 20 GHz
    • 10 MHz to 40 GHz
    • 10 MHz to 50 GHz
  • 108 dB of dynamic range and <0.006 dB trace noise
  • <9 usec/point measurement speed, 32 channels, 20,001 points
  • TRL/LRM calibration, on-wafer, in-fixture, and waveguide measurements
  • Optional built-in second source (4-port models only)
  • Optional time-domain and frequency-offset capabilities
  • Optional electronic calibration (ECal) modules let you calibrate 10 times faster than mechanical calibration